Micro FT-IR has generally been reserved for measuring specified samples such as small contaminants on polymer films or micro samples transferred to infrared transparent windows. Today, JASCO’ s innovative FT-IR Microscopes, the IRT-5000 Series, provide new functions that dramatically improve infrared micro-spectroscopy analyses. These microscope systems can be easily interfaced with the FT/IR-4000 or FT/IR-6000 series spectrometers, offering the most advanced microscopy and imaging systems available in the market. Coupling JASCO’ s proven technology for infrared spectroscopy, accumulated over 50 years, with the most advanced optical design, the IRT-5000 Series offer the best solution for even the most challenging sample analyses.

System Description

The IRT-5000 FT-IR Microscope employs a mid-band MCT detector as standard, while up to two detectors can be installed simultaneously to expand the spectral range of the microscope. The standard “IQ Mapping” function allows multi-point, line, area and ATR mapping experiments without moving the sample stage, in addition to single-point measurements. An optional automatic X-Y-Z sample stage enables auto-focus and mapping analysis of a large sample area. With the addition of a linear array detector, the microscope can be easily upgraded for IR imaging in the field.

System Features

• IQ Mapping without moving sample stage
• Dual detector capability and user replaceable detectors
• Multiple objective capability and automatic switching
• Exceptional visual observation quality
• IQ Monitoring for simultaneous observation of the spectrum and sample image
• Spectrum preview to check conditions before measurement
• Data storage linked with sample image and aperture information

IRT-5100: FT-IR Microscope

Manual sample storage DLATGS detector

The IRT-5100 is a general purpose FT-IR microscope employing a standard DLATGS detector with no need for liquid nitrogen cooling. The IRT-5100 can also integrate an additional detector which can be simultaneously installed. An optional automatic XYZ sample storage provides auto-focus and mapping analysis capabilities.

• Dual detector capability
• Variety of measurement modes (Transmission, reflection, ATR, Grazing Angle Reflection)
• Multiple objective capabilities
• Optional automatic sample storage

IRT-5200: FT-IR Microscope

Manual sample storage Mid-band MCT detector

The IRT-5200 FT-IR microscope utilizes a standard mid-band MCT detector, while up to two detectors can be simultaneously installed as an option. The standard “IQ Mapping” function allows multi-point, line, area and ATR mapping experiments without moving the sample storage, in addition to single-point measurements. An optional automatic XYZ sample stage enables auto-focus and mapping analysis of larger sample areas.

• IQ Mapping
• Dual detector capability
• Variety of measurement modes (Transmission, reflection, ATR, Grazing Angle Reflection)
• Multiple objective capabilities
• Field upgrade to IR Imaging System using a linear array detector

User-friendly Micro Analysis Measurement Program

A full-featured software package, Spectra Manager™ II provides automatic functions and simplified operational procedures to minimize manual operations. Measurement conditions, microscope sample monitoring/control operations and measurement results can be reviewed in a single screen. The dedicated microscope interface provides various types of measurements such as single and multiple points, mapping, and linear array measurements using a single mouse-click for mode selection. Real time monitoring of the spectrum and a calculated chemical image can be specified during the mapping measurement.

Innovative ATR Mapping

The “Clear-View” ATR objectives enable a simultaneous sample view even during ATR data collection after the ATR crystal element contacts the sample. The IQ Mapping function enables automated multi-point mapping, line mapping, grid mapping and IR Imaging analyses of a microscopic area with a manual sample stage and a single element detector.

IQ Mapping coupled with a “Clear-View” ATR objective allows ATR mapping and ATR Imaging of any sample in contact with the ATR objective without moving the sample stage or ATR objective, while observing the entire area of the sample that is in contact with the crystal element. This function provides high-speed and cross-contaminant free measurements of a small sampling area.

Full-vacuum System

For FT-IR measurement, absorption peaks due to atmospheric water vapor and CO2 can make it difficult to obtain high quality sample spectra. The most effective solution to this problem is the measurement of samples in vacuum. As a factory option, a vacuum type FT-IR microscope system can be provided.