IRT-7000

Micro FT-IR has generally been reserved for measuring specified samples such as small contaminants on polymer films or micro samples transferred to infrared transparent windows. Today, JASCO’ s innovative FT-IR Microscopes, the IRT-7000 Series, provide new functions that dramatically improve infrared micro-spectroscopy analyses. These microscope systems can be easily interfaced with the FT/IR-4000 or FT/IR-6000 series spectrometers, offering the most advanced microscopy and imaging systems available in the market. Coupling JASCO’ s proven technology for infrared spectroscopy, accumulated over 50 years, with the most advanced optical design, the IRT-7000 Series offer the best solution for even the most challenging sample analyses.

System Description

The IRT-7000 offers two detectors as standard; a 16-channel linear array detector for infrared sample imaging and a single-point MCT detector. The combination of the standard automatic sample stage and “IQ Mapping” function allows mapping analyses of a large sample area, multi-area ATR mapping, and IR imaging of a specific area with extremely high spatial resolution and excellent sensitivity in a short time. With the combination of the FT/IR-6000 and the step scan option, this system offers an advanced capability for dynamic imaging as well as time-resolved measurements of a specific area. For multivariate analysis, the PCA (Principal Component Analysis) software package is standard.

System Features

• IQ Mapping for advanced mapping experiments
• Rapid IR Imaging experiments
• Up to four objectives and automated switching
• Exceptional visual observation quality
• Wide area mapping and multi-ATR imaging
• Dynamic Imaging with FT-IR step-scan option
• Multivariate analysis PCA (Principal Component Analysis).

IRT-7100: Fully Automated FT-IR Microscope

Automatic sample storage Mid-band MCT detector

The IRT-7100 fully automated FT-IR microscope includes a standard mid-band MCT detector, with an option to simultaneously install up to two detectors. It is easily field-upgradable to an IR imaging system by adding an optional linear array detector. The standard automatic sample stage provides wide area mapping and multi-ATR mapping by combining the “IQ Mapping” function with the XYZ auto-stage.

Fully automated sample storage with auto focus function as standard

• IQ Mapping
• Up to four objectives
• Dual detector capability
• Field upgrade to IR Imaging System using a linear array detector

IRT-7200: Multi-channel FT-IR Microscope

Automatic sample storage, Mid-band MCT detector and linear array detector

The IRT-7200 FT-IR multi-channel microscope offers two detectors as standard, a 16-channel linear array detector and a single-point mid-band MCT detector. The combination of the standard automatic sample stage and “IQ Mapping” function allows mapping analyses of a larger sample area, multi-are ATR mapping, and IR imaging of a specified area with extremely high spatial resolution and excellent sensitivity in a short time.

• Full IR Imaging function
• IQ Mapping
• Up to four objectives
• Wide area mapping and multi-ATR imaging
• Dynamic Imaging with FT-IR step-scan option
• Multivariate analysis PCS (Principal Component Analysis) as standard

User-friendly Micro Analysis Measurement Program

A full-featured software package, Spectra Manager™ II provides automatic functions and simplified operational procedures to minimize manual operations. Measurement conditions, microscope sample monitoring/control operations and measurement results can be reviewed in a single screen. The dedicated microscope interface provides various types of measurements such as single and multiple points, mapping, and linear array measurements using a single mouse-click for mode selection. Real time monitoring of the spectrum and a calculated chemical image can be specified during the mapping measurement.

Innovative ATR Mapping

The “Clear-View” ATR objectives enable a simultaneous sample view even during ATR data collection after the ATR crystal element contacts the sample. The IQ Mapping function enables automated multi-point mapping, line mapping, grid mapping and IR Imaging analyses of a microscopic area with a manual sample stage and a single element detector.

IQ Mapping coupled with a “Clear-View” ATR objective allows ATR mapping and ATR Imaging of any sample in contact with the ATR objective without moving the sample stage or ATR objective, while observing the entire area of the sample that is in contact with the crystal element. This function provides high-speed and cross-contaminant free measurements of a small sampling area.

Full-vacuum System

For FT-IR measurement, absorption peaks due to atmospheric water vapor and CO2 can make it difficult to obtain high quality sample spectra. The most effective solution to this problem is the measurement of samples in vacuum. As a factory option, a vacuum type FT-IR microscope system can be provided.