Specifications

Optical System Rowland off-circle arrangement
Single monochromator
Double beam type
Light source Halogen lamp, Deuterium lamp
Wavelength range 190 to 1100 nm
Wavelength accuracy +/-0.2 nm (at 656.1 nm)
Wavelength repeatability +/-0.1 nm
Spectral bandwidth (SBW) 1 nm
Stray light 1 % (198 nm KCL 12 g/L aqueous solution)
0.02 % (220 nm NaI 10 g/L aqueous solution)
0.02 % (340 nm NaNO2 50 g/L aqueous solution)
0.02 % (370 nm NaNO2 50 g/L aqueous solution)
SBW: 1 nm
Photometric range -3~3 Abs
Photometric accuracy +/-0.0015 Abs (0 to 0.5 Abs)
+/-0.0025 Abs (0.5 to 1 Abs)
+/-0.3 %T Tested
with NIST SRM 930D
Photometric repeatability +/-0.0005 Abs (0 to 0.5 Abs)
+/-0.0005 Abs (0.5 to 1 Abs)
Tested with NIST SRM 930D
Scanning speed 10-8000 nm/min
Slew speed 24,000 nm/min
RMS noise 0.00004 Abs
(0 Abs, wavelength: 500 nm, measurement time: 60 sec, SBW: 1 nm)
Baseline stability 0.0004 Abs/hour
(Value obtained more than one hour after turning on the source,
when the room temperature is stabilized, wavelength: 250 nm,
response: slow)
Baseline flatness +/-0.0005 Abs (200 – 1000 nm)
Detector Silicon photodiode
Standard facilities IQ accessories, Start button, Analog output
Standard program Abs/%T meter, Quantitative analysis, Spectrum measurement,
Time course measurement, Fixed wavelength measurement, Validation,
Daily maintenance, Macro command (only for iRM),
Two wavelengths time course measurement (only for PC)
Dimensions and weight 486(W) x 441(D) x 216(H) mm, 15 kg
Power requirements 120 VA
Installation requirements Room temperature: 15-30 Celsius, humidity: below 85%

V-750 UV-Vis Spectrophotometer Specifications

Optical System Czerny-Turner mount
Single monochromator
Fully symmetrical double beam type
Light Source Halogen lamp, Deuterium lamp
Wavelength range 190 to 900 nm
Wavelength accuracy +/-0.2 nm (at 656.1 nm)
Wavelength repeatability +/-0.05 nm
Spectral bandwidth (SBW) 0.1, 0.2, 0.5, 1, 2, 5, 10 nm
L2, L5, L10 nm (low stray light mode)
M1, M2 nm (micro cell mode)
Stray light 1 % (198 nm KCL 12 g/L aqueous solution)
0.005 % (220 nm NaI 10 g/L aqueous solution)
0.005 % (340 nm NaNO2 50 g/L aqueous solution)
0.005 % (370 nm NaNO2 50 g/L aqueous solution)
SBW: L2 nm
Photometric range -4~4 Abs
Photometric accuracy +/-0.0015 Abs (0 to 0.5 Abs)
+/-0.0025 Abs (0.5 to 1 Abs)
+/-0.3 %T
Tested with NIST SRM 930D
Photometric repeatability +/-0.0005 Abs (0 to 0.5 Abs)
+/-0.0005 Abs (0.5 to 1 Abs)
Tested with NIST SRM 930D
Scanning speed 10~4000 nm/min (8000 nm/min in preview mode)
Slew speed 12,000 nm/min
RMS noise 0.00003 Abs
(0 Abs, wavelength: 500 nm, measurement time: 60 sec, SBW: 2 nm)
Baseline stability 0.0003 Abs/hour
(Value obtained more than two hours after turning on the source, when
the room temperature is stabilized, wavelength: 250 nm, response: slow
and SBW: 2 nm)
Baseline flatness +/-0.0002 Abs (200 – 850 nm)
Detector Photomultiplier tube
Standard facilities IQ accessories, Start button, Analog output
Standard program Abs/%T meter, Quantitative analysis, Spectrum measurement,
Time course measurement, Fixed wavelength measurement, Validation,
Daily maintenance, Macro command (only for iRM),
Two wavelengths time course measurement (only for PC)
Dimensions and weight 460(W) x 602(D) x 268(H) mm, 27 kg
Power requirements 150 VA
Installation requirements Room temperature: 15-30 Celsius, humidity: below 85%

V-760 UV-Vis Spectrophotometer Specifications

Optical System Czerny-Turner mount
Double monochromator
Fully symmetrical double beam type
Light Source Halogen lamp, Deuterium lamp
Wavelength range 187 to 900 nm
Wavelength accuracy +/-0.1 nm (at 656.1 nm)
Wavelength repeatability +/-0.05 nm
Spectral bandwidth (SBW) 0.1, 0.2, 0.5, 1, 5, 2, 10 nm
L2, L5, L10 nm (low stray light mode)
M1, M2 nm (micro cell mode)
Stray light 1 % (198 nm KCL 12 g/L aqueous solution)
0.00008 % (220 nm NaI 10 g/L aqueous solution)
0.00008 % (340 nm NaNO2 50 g/L aqueous solution)
0.00008 % (370 nm NaNO2 50 g/L aqueous solution)
SBW: L2 nm
Photometric range -4~6 Abs
Photometric accuracy +/-0.0015 Abs (0 to 0.5 Abs)
+/-0.0025 Abs (0.5 to 1 Abs)
+/-0.3 %T
Tested with NIST SRM 930D
Photometric repeatability +/-0.0005 Abs (0 to 0.5 Abs)
+/-0.0005 Abs (0.5 to 1 Abs)
Tested with NIST SRM 930D
Scanning speed 10~4000 nm/min (8000 nm/min in preview mode)
Slew speed 12,000 nm/min
RMS noise 0.00003 Abs
(0 Abs, wavelength: 500 nm, measurement time: 60 sec, SBW: 2 nm)
Baseline stability 0.0003 Abs/hour
(Value obtained more than two hours after turning on the source, when
the room temperature is stabilized, wavelength: 250 nm, response: slow
and SBW: 2 nm)
Baseline flatness +/-0.0003 Abs (200 – 800 nm)
Detector Photomultiplier tube
Standard facilities IQ accessories, Start button, Analog output
Standard program Abs/%T meter, Quantitative analysis, Spectrum measurement,
Time course measurement, Fixed wavelength measurement, Validation,
Daily maintenance, Macro command (only for iRM),
Two wavelengths time course measurement (only for PC)
Dimensions and Weight 460(W) x 602(D) x 268(H) mm, 29 kg
Power requirements 150 VA
Installation requirements Room temperature: 15-30 Celsius, humidity: below 85%

V-770 UV-Visible-Near Infrared Spectrophotometer Specifications

Optical System Czerny-Turner mount
Single monochromator
Fully symmetrical double beam type
Light Source Halogen lamp, Deuterium lamp
Wavelength range 190 to 2700 nm (3200 nm, option)
Wavelength accuracy +/-0.3 nm (at 656.1 nm)
+/-1.5 nm (at 1312.2 nm)
Wavelength repeatability +/-0.05 nm (UV-Vis), +/-0.2 nm (NIR)
Spectral bandwidth (SBW) UV-Vis:
0.1, 0.2, 0.5, 1, 2, 5, 10 nm
L2, L5, L10 nm (low stray light mode)
M1, M2 nm (micro cell mode)
NIR:
0.4, 0.8, 1, 2, 4, 8, 20, 40
L8, L20, L40 nm (low stray light mode)
M4, M8 nm (micro cell mode)
Stray light 1 % (198 nm KCL 12 g/L aqueous solution)
0.005 % (220 nm NaI 10 g/L aqueous solution)
0.005 % (340 nm NaNO2 50 g/L aqueous solution)
0.005 % (370 nm NaNO2 50 g/L aqueous solution)
SBW: L2 nm0.04 % (1420 nm: H2O)
0.1 % (1690 nm: CH2Br2 50 mm cell)
SBW: L8 nm
Photometric range UV-Vis: -4~4 Abs
NIR: -3~3 Abs
Photometric accuracy +/-0.0015 Abs (0 to 0.5 Abs)
+/-0.0025 Abs (0.5 to 1 Abs)
+/-0.3 %T Tested
with NIST SRM 930D
Photometric repeatability +/-0.0005 Abs (0 to 0.5 Abs)
+/-0.0005 Abs (0.5 to 1 Abs)
Tested with NIST SRM 930D
Scanning speed 10~4000 nm/min (8000 nm/min in preview mode)
Slew speed UV-Vis: 12,000 nm/min
NIR: 48,000 nm/min
RMS noise 0.00003 Abs
(0 Abs, wavelength: 500 nm, measurement time: 60 sec, SBW :2 nm)
Baseline stability 0.0003 Abs/hour
(Value obtained more than two hours after turning on the source, when
the room temperature is stabilized, wavelength: 250 nm, response: slow
and SBW: 2 nm)
Baseline flatness +/-0.0002 Abs (200 – 2500 nm)
Detector Photomultiplier tube, Peltier cooled PbS
Standard facilities IQ accessories, Start button, Analog output
Standard program Abs/%T Meter, Quantitative Analysis, Spectrum Measurement, Time Course Measurement, Fixed-Wavelength Measurement, Validation, Daily Maintenance, Macro command (only for iRM), Dual Wavelength Time Course Measurement (only for PC
Dimensions and weight 460(W) x 602(D) x 268(H) mm, 29 kg
Power requirements 150 VA
Installation requirements Room temperature: 15-30 Celsius, humidity: below 85%

V-780 UV-Vis Spectrophotometer Specifications

Optical System Czerny-Turner mount
Single monochromator
Fully symmetrical double beam type
Light Source Halogen lamp, Deuterium lamp
Wavelength range 190 to 1600 nm
Wavelength accuracy +/-0.3 nm (at 656.1 nm)
+/-1.0 nm (at 1312.2 nm)
Wavelength repeatability +/-0.05 nm (UV-Vis), +/-0.1 nm (NIR)
Spectral bandwidth (SBW) UV-Vis:
0.1, 0.2, 0.5, 1, 2, 5, 10 nm
L2, L5, L10 nm (low stray light mode)
M1, M2 nm (micro cell mode)
NIR:
0.2, 0.4, 0.5, 1, 2, 4, 10, 20,
L4, L10, L20 nm (low stray light mode)
M2, M4 nm (micro cell mode)
Stray light 1 % (198 nm KCL 12 g/L aqueous solution)
0.005 % (220 nm NaI 10 g/L aqueous solution
0.005 % (340 nm NaNO2 50 g/L aqueous solution)
0.005 % (370 nm NaNO2 50 g/L aqueous solution)
SBW: L2nm0.04 % (1420 nm: H2O)
SBW: L4 nm
Photometric range UV-Vis: -4~4 Abs
NIR: -3~3 Abs
Photometric accuracy +/-0.0015 Abs (0 to 0.5 Abs)
+/-0.0025 Abs (0.5 to 1 Abs)
+/-0.3 %T Tested
with NIST SRM 930D
Photometric repeatability +/-0.0005 Abs (0 to 0.5 Abs)
+/-0.0005 Abs (0.5 to 1 Abs)
Tested with NIST SRM 930D
Scanning speed 10~4000 nm/min (8000 nm/min in preview mode)
Slew speed UV-Vis: 12000 nm/min
NIR: 24000 nm/min
RMS noise 0.00003 Abs
(0 Abs, wavelength: 500 nm, measurement time: 60 sec, SBW:2 nm)
Baseline stability 0.0003 Abs/hour
0.04 % (220 nm NaI 10 g/L aqueous solution)
0.02 % (340 nm NaNO2 50 g/L aqueous solution)
0.02 % (370 nm NaNO2 50 g/L aqueous solution)
(10 mm cell)
Baseline Stability ±0.0004 Abs/hour
(Value obtained more than two hours after turning on the light source,
when the room temperature is stabilized, wavelength: 250 nm,
response: slow and SBW: 2nm.)
Baseline flatness +/-0.0002 Abs (200 – 1600 nm)
Detector Photomultiplier tube, Peltier cooled InGaAs photodiode
Standard facilities IQ accessories, Start button, Analog output
Standard program Abs/%T Meter, Quantitative Analysis, Spectrum Measurement, Time Course Measurement, Fixed-Wavelength Measurement, Validation, Daily Maintenance, Macro command (only for iRM), Dual Wavelength Time Course Measurement (only for PC
Dimensions and weight 460(W) x 602(D) x 268(H) mm, 29 kg
Power requirements 150 VA
Installation requirements Room temperature: 15-30 Celsius, humidity: below 85%